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Issue Date	Title Author(s) Journal	View
2020-04	Automated defect inspection system for metal surfaces based on deep learning and data augmentation Yun, Jong Pil ; Shin, Woosang Crino ; Koo, Gyogwon ; Kim, Min Su ; Lee, Chungki ; Lee, Sang Jun Elsevier BV, 2020-04	846
2022-05	Power efficient transistors with low subthreshold swing using abrupt switching devices Aziz, Jamal ; Kim, Honggyun ; Hussain, Tassawar ; Lee, Hojin ; Choi, Taekjib ; Rehman, Shania ; Khan, Muhammad Farooq ; Kadam, Kalyani D. ; Patil, Harshada ; Mehdi, Syed Muhammad Zain ; et al Nano Energy, v.95, 2022-05	163

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